Exciton Mapping at Subwavelength Scales in Two-Dimensional Materials

Physical Review Letters

Volumn 114, Issue 10, 2015, Pages

  Tizei, Luiz H G ^a   Lin, Yung Chang ^a   Mukai, Masaki ^b   Sawada, Hidetaka ^b   Lu, Ang Yu ^c   Li, Lain Jong ^c   Kimoto, Koji ^d   Suenaga, Kazu ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b JEOL LTD   (Japan)

^c KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Saudi Arabia)

^d NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ENERGY DISSIPATION; ENERGY GAP; EXCITONS;

CHEMICAL COMPOSITIONS; EXCITON BOHR RADIUS; HETEROGENEOUS REGION; INTERFACE ROUGHNESS; NANOMETER-SCALE RESOLUTION; SPATIALLY RESOLVED; SUBWAVELENGTH SCALE; TWO-DIMENSIONAL MATERIALS;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 84945240822     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.114.107601     Document Type: Article

References (36)

1. K. F. Mak, C. Lee, J. Hone, J. Shan, and T. F. Heinz, Phys. Rev. Lett. 105, 136805 (2010). PRLTAO 0031-9007 10.1103/PhysRevLett.105.136805
2. A. Splendiani, L. Sun, Y. Zhang, T. Li, J. Kim, C.-Y. Chim, G. Galli, and F. Wang, Nano Lett. 10, 1271 (2010). NALEFD 1530-6984 10.1021/nl903868w
3. D. Xiao, G.-B. Liu, W. Feng, X. Xu, and W. Yao, Phys. Rev. Lett. 108, 196802 (2012). PRLTAO 0031-9007 10.1103/PhysRevLett.108.196802
4. R. Coehoorn, C. Haas, and R. A. de Groot, Phys. Rev. B 35, 6203 (1987). PRBMDO 0163-1829 10.1103/PhysRevB.35.6203
5. A. Molina-Sanchéz, D. Sangalli, K. Hummer, A. Marini, and L. Wirtz, Phys. Rev. B 88, 045412 (2013). PRBMDO 1098-0121 10.1103/PhysRevB.88.045412
6. P. Ramvall, S. Tanaka, S. Nomura, P. Riblet, and Y. Aoyagi, Appl. Phys. Lett. 73, 1104 (1998). APPLAB 0003-6951 10.1063/1.122098
7. T. Kazimierczuk, D. Frohlich, S. Scheel, H. Stolz, and M. Bayer, Nature (London) 514, 343 (2014). NATUAS 0028-0836 10.1038/nature13832
8. M. M. Ugeda, Nat. Mater. 13, 1091 (2014). NMAACR 1476-1122 10.1038/nmat4061
9. B. Rafferty and L. M. Brown, Phys. Rev. B 58, 10326 (1998). PRBMDO 0163-1829 10.1103/PhysRevB.58.10326
10. R. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope (Springer, New York, 2011).
11. A. Gloter, A. Douiri, M. Tencé, and C. Colliex, Ultramicroscopy 96, 385 (2003). ULTRD6 0304-3991 10.1016/S0304-3991(03)00103-7
12. R. Arenal, O. Stéphan, M. Kociak, D. Taverna, A. Loiseau, and C. Colliex, Phys. Rev. Lett. 95, 127601 (2005). PRLTAO 0031-9007 10.1103/PhysRevLett.95.127601
13. J. Nelayah, M. Kociak, O. Stéphan, F. Javier García de Abajo, M. Ténce, L. Henrard, D. Taverna, I. Pastoriza-Santo, L. M. Liz-Marzán, and C. Colliex, Nat. Phys. 3, 348 (2007). NPAHAX 1745-2473 10.1038/nphys575
14. H. Ibach and D. L. Mills, Electron Energy Loss Spectroscopy and Surface Vibrations (Academic Press, New York, 1982).
15. Y. Fujikawa, M. Sakurai, and A. Koma, Jpn. J. Appl. Phys. 34, L188 (1995). JAPNDE 0021-4922 10.1143/JJAP.34.L188
16. M. Terauchi and M. Tanaka, J. Surf. Anal. 3, 240 (1997). JSANFX 1341-1756
17. D. Rossouw and G. A. Botton, Phys. Rev. Lett. 110, 066801 (2013). PRLTAO 0031-9007 10.1103/PhysRevLett.110.066801
18. S. F. Tan, L. Wu, J. K. W. Yang, P. Bai, M. Bosman, and C. A. Nijhuis, Science 343, 1496 (2014). SCIEAS 0036-8075 10.1126/science.1248797
19. O. L. Krivanek, Nature (London) 514, 209 (2014). NATUAS 0028-0836 10.1038/nature13870
20. X. Hong, J. Kim, S.-F. Shi, Y. Zhang, C. Jin, Y. Sun, S. Tongay, J. Wu, Y. Zhang, and F. Wang, Nat. Nanotechnol. 9, 682 (2014). NNAABX 1748-3387 10.1038/nnano.2014.167
21. J. Mann, Adv. Mater. 26, 1399 (2014). ADVMEW 0935-9648 10.1002/adma.201304389
22. M. Kociak, O. Stéphan, L. Henrard, V. Charbois, A. Rothschild, R. Tenne, and C. Colliex, Phys. Rev. Lett. 87, 075501 (2001). PRLTAO 0031-9007 10.1103/PhysRevLett.87.075501
23. D. Taverna, M. Kociak, V. Charbois, and L. Henrard, Phys. Rev. B 66, 235419 (2002). PRBMDO 0163-1829 10.1103/PhysRevB.66.235419
24. F. J. García de Abajo and M. Kociak, Phys. Rev. Lett. 100, 106804 (2008). PRLTAO 0031-9007 10.1103/PhysRevLett.100.106804
25. F. J. García de Abajo, Rev. Mod. Phys. 82, 209 (2010). RMPHAT 0034-6861 10.1103/RevModPhys.82.209
26. Y. Chen, J. Xi, D. O. Dumcenco, Z. Liu, K. Suenaga, D. Wang, Z. Shuai, Y.-S. Huang, and L. Xie, ACS Nano 7, 4610 (2013). ANCAC3 1936-0851 10.1021/nn401420h
27. D. A. Muller and J. Silcox, Ultramicroscopy 59, 195 (1995). ULTRD6 0304-3991 10.1016/0304-3991(95)00029-Z
28. J. C. H. Spence, Rep. Prog. Phys. 69, 725 (2006). RPPHAG 0034-4885 10.1088/0034-4885/69/3/R04
29. L. F. Zagonel, Nano Lett. 11, 568 (2011). NALEFD 1530-6984 10.1021/nl103549t
30. J. Singh and K. K. Bajaj, J. Appl. Phys. 57, 5433 (1985). JAPIAU 0021-8979 10.1063/1.334818
31. A. Patanè, A. Polimeni, M. Capizzi, and F. Martelli, Phys. Rev. B 52, 2784 (1995). PRBMDO 0163-1829 10.1103/PhysRevB.52.2784
32. S.-H. Su, W.-T. Hsu, C.-L. Hsu, C.-H. Chen, M.-H. Chiu, Y.-C. Lin, W.-H. Chang, K. Suenaga, J.-H. He, and L.-J. Li, Front. Energy Res. 2, 27 (2014). FERRCJ 2296-598X 10.3389/fenrg.2014.00027
33. C. Huang, S. Wu, A. M. Sanchez, J. J. P. Peters, R. Beanland, J. S. Ross, P. Rivera, W. Yao, D. H. Cobden, and X. Xu, Nat. Mater. 13, 1096 (2014). NMAACR 1476-1122 10.1038/nmat4064
34. Y. Gong, Nat. Mater. 13, 1135 (2014). NMAACR 1476-1122 10.1038/nmat4091
35. Y.-C. Lin, D. O. Dumcenco, Y.-S. Huang, and K. Suenaga, Nat. Nanotechnol. 9, 391 (2014). NNAABX 1748-3387 10.1038/nnano.2014.64
36. R. Kappera, D. Voiry, S. E. Yalcin, B. Branch, G. Gupta, A. D. Mohite, and M. Chhowalla, Nat. Mater. 13, 1128 (2014). NMAACR 1476-1122 10.1038/nmat4080