Atomic mechanism of the semiconducting-to-metallic phase transition in single-layered MoS 2

Nature Nanotechnology

Volumn 9, Issue 5, 2014, Pages 391-396

  Lin, Yung Chang ^a   Dumcenco, Dumitru O ^b,c   Huang, Ying Sheng ^b   Suenaga, Kazu ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^c EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY;

ATOMIC DISPLACEMENT; ATOMIC MECHANISM; ATOMIC PLANES; ATOMIC PROCESS; ATOMIC RESOLUTION; INTERMEDIATE PHASE; MACROSCOPIC APPROACH; STRUCTURAL TRANSFORMATION;

ATOMS;

INORGANIC COMPOUND; MOLYBDENUM; MOLYBDENUM DISULPHIDE; SULFUR; UNCLASSIFIED DRUG;

ARTICLE; ELECTRON BEAM; MIGRATION; PHASE TRANSITION; PRIORITY JOURNAL; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 84901283726     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2014.64     Document Type: Article

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