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Volumn 2, Issue , 2003, Pages 1832-1835

Incrementally etched electrical feedthroughs for wafer-level transfer of glass lid packages

Author keywords

Encapsulation; Glass; Microelectromechanical devices; Micromachining; Micromechanical devices; Packaging; Surface contamination; Wafer bonding; Wafer scale integration; Wet etching

Indexed keywords

ACTUATORS; COMPOSITE MICROMECHANICS; ELECTRONICS PACKAGING; ENCAPSULATION; GLASS; GLASS BONDING; HYDROFLUORIC ACID; MICROELECTROMECHANICAL DEVICES; MICROMACHINING; MICROSYSTEMS; PACKAGING; SOLID-STATE SENSORS; SURFACE MICROMACHINING; TRANSDUCERS; WET ETCHING; WSI CIRCUITS;

EID: 84944728850     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SENSOR.2003.1217144     Document Type: Conference Paper
Times cited : (12)

References (10)
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  • 2
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  • 4
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    • Fabrication and Characterization of a Low-Temperature Hermetic MEMS Package bonded by a closed Loop AuSn Solder-Line
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    • Proc. MEMS 2003 , pp. 614-617
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  • 5
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  • 6
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    • 3D MEMS Fabrication using Low-Temperature Wafer Bonding with Benzocyclobutene (BCB)
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  • 7
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    • High Density Electrical Feedthrough Fabricated by Deep Reactive Ion Etching of Pyrex Glass
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  • 8
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  • 9
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.