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Volumn 6, Issue 3, 1997, Pages 217-225

Microrivets for MEMS packaging: Concept, fabrication, and strength testing

Author keywords

Electroplating; Microrivet; Packaging; Strength testing; Wafer joining

Indexed keywords

BONDING; ELECTRIC FIELDS; ELECTRONICS PACKAGING; ELECTROPLATING; FABRICATION; JOINING; MECHANICAL TESTING; MECHANICAL VARIABLES MEASUREMENT; RIVETING;

EID: 0031235920     PISSN: 10577157     EISSN: None     Source Type: Journal    
DOI: 10.1109/84.623110     Document Type: Article
Times cited : (26)

References (14)
  • 3
    • 0014563672 scopus 로고
    • Field-assisted glass-metal sealing
    • G. Wallis and D. I. Pomerantz, "Field-assisted glass-metal sealing," J. Appl. Phys., vol. 40, pp. 3946-3949, 1969.
    • (1969) J. Appl. Phys. , vol.40 , pp. 3946-3949
    • Wallis, G.1    Pomerantz, D.I.2
  • 7
    • 0025419038 scopus 로고
    • Fusing silicon wafers with low melting temperature glass
    • L. A. Field and R. S. Muller, "Fusing silicon wafers with low melting temperature glass," Sens. Actuators, vol. A21-A23, pp. 935-938, 1990.
    • (1990) Sens. Actuators , vol.A21-A23 , pp. 935-938
    • Field, L.A.1    Muller, R.S.2
  • 9
    • 0030706509 scopus 로고    scopus 로고
    • Room temperature silicon wafer direct bonding in vacuum by Ar beam irradiation
    • Nagoya, Japan, Jan.
    • H. Takagi, R. Maeda, Y. Ando, and T. Suga, "Room temperature silicon wafer direct bonding in vacuum by Ar beam irradiation," in Proc. IEEE Conf. on Micro Electro Mechanical Systems (Nagoya, Japan, Jan. 1997), pp. 191-196.
    • (1997) Proc. IEEE Conf. on Micro Electro Mechanical Systems , pp. 191-196
    • Takagi, H.1    Maeda, R.2    Ando, Y.3    Suga, T.4
  • 13
    • 0029191566 scopus 로고
    • Fabrication of monolithic microchannels for IC chip cooling
    • Amsterdam, The Netherlands
    • Y. Joo, K. Dieu, and C.-J. Kim, "Fabrication of monolithic microchannels for IC chip cooling," in Proc. IEEE Conf. on Micro Electro Mechanical Systems (Amsterdam, The Netherlands, 1995), pp. 362-367.
    • (1995) Proc. IEEE Conf. on Micro Electro Mechanical Systems , pp. 362-367
    • Joo, Y.1    Dieu, K.2    Kim, C.-J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.