High-frequency conductivity of optically excited charge carriers in hydrogenated nanocrystalline silicon investigated by spectroscopic femtosecond pump-probe reflectivity measurements

Thin Solid Films

Volumn 592, Issue , 2015, Pages 287-291

  He, Wei ^a   Yurkevich, Igor V ^b   Zakar, Ammar ^a   Kaplan, Andrey ^a  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^b ASTON UNIVERSITY   (United Kingdom)

Author keywords

High frequency conductivity; Nanomaterials; Nanosilicon; Ultrafast spectroscopy

Indexed keywords

BOLTZMANN EQUATION; CARRIER MOBILITY; HYDROGENATION; NANOCRYSTALS; NANOSTRUCTURED MATERIALS; OXIDE FILMS; PROBES; REFLECTION; SILICON COMPOUNDS; SILICON OXIDES;

FEMTOSECOND PUMP PROBES; FEMTOSECOND PUMP-PROBE REFLECTIVITY; HIGH FREQUENCY HF; HYDROGENATED NANOCRYSTALLINE SILICON; MAXWELL-BOLTZMANN DISTRIBUTION; NANO-SILICON; PUMP-PROBE REFLECTANCE; ULTRA-FAST SPECTROSCOPIES;

NANOCRYSTALLINE SILICON;

EID: 84944278909     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2015.03.023     Document Type: Conference Paper

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