Determination of excitation profile and dielectric function spatial nonuniformity in porous silicon by using WKB approach

Optics Express

Volumn 22, Issue 22, 2014, Pages 27123-27135

  He, Wei ^a   Yurkevich, Igor V ^b   Canham, Leigh T ^c   Loni, Armando ^c   Kaplan, Andrey ^a  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^b ASTON UNIVERSITY   (United Kingdom)

^c pSiMedica Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC EXCITATION; KRAMERS-KRONIG RELATIONS; SILICON; SOLAR ENERGY;

COMPLEX DIELECTRIC FUNCTIONS; DIELECTRIC FUNCTIONS; EXCITATION PROFILE; EXPERIMENTAL DATA ANALYSIS; FEMTOSECOND PUMPS; FITTING PARAMETERS; SPATIAL NONUNIFORMITY; TRANSMITTANCE AND REFLECTANCES;

POROUS SILICON;

EID: 84920054259     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.22.027123     Document Type: Article

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