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Volumn 49, Issue , 2015, Pages 94-99

Single crystal growth, structure and properties of TlHgBr3

Author keywords

Crystal structure; Electronic structure; Halides; Optical properties; Single crystal growth

Indexed keywords

BROMINE; CORE LEVELS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; ELECTRONIC STRUCTURE; ION BEAMS; MERCURY COMPOUNDS; OPTICAL PROPERTIES; PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; PHOTONS; THALLIUM COMPOUNDS; VALENCE BANDS; X RAYS;

EID: 84944033863     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2015.08.026     Document Type: Article
Times cited : (12)

References (43)
  • 15
    • 84876492350 scopus 로고
    • National Institute of Standards and Technology, U.S. Department of Commerce, Gaithersburg, MD
    • SRM 640b: Silicon Powder 2θ/d-Spacing Standard for X-ray Diffraction, National Institute of Standards and Technology, U.S. Department of Commerce, Gaithersburg, MD, 1987.
    • (1987) SRM 640b: Silicon Powder 2θ/d-Spacing Standard for X-ray Diffraction
  • 19
    • 0004326059 scopus 로고
    • IUCr Monographs on Crystallography Oxford University Press New York
    • R.A. Young The rietveld method IUCr Monographs on Crystallography vol. 5 1993 Oxford University Press New York 298
    • (1993) The Rietveld Method , vol.5 , pp. 298
    • Young, R.A.1
  • 20
    • 0012685743 scopus 로고    scopus 로고
    • Commission on powder diffraction (IUCr)
    • J. Rodriguez-Carvajal Commission on powder diffraction (IUCr) Newsletter 26 2001 12 19
    • (2001) Newsletter , vol.26 , pp. 12-19
    • Rodriguez-Carvajal, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.