Electronic parameters and top surface chemical stability of RbPb 2Br 5

Materials Chemistry and Physics

Volumn 132, Issue 1, 2012, Pages 82-86

  Atuchin, V V ^a   Isaenko, L I ^b   Kesler, V G ^c   Pokrovsky, L D ^a   Tarasova, A Yu ^b  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

^b SOBOLEV INSTITUTE OF GEOLOGY AND MINERALOGY   (Russian Federation)

^c INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

Author keywords

A. Optical materials; A. Surfaces; B. Crystal growth; C. Reflection high energy electron diffraction (RHEED); C. X ray photo emission spectroscopy (XPS); D. Crystallography; D. Surface properties

Indexed keywords

C. REFLECTION HIGH ENERGY ELECTRON DIFFRACTION (RHEED); CHEMICAL BONDINGS; COMPARATIVE ANALYSIS; CORE LEVELS; ELECTRONIC PARAMETERS; ENERGY DIFFERENCES; POWDER SAMPLES; TOP SURFACE; WEAK INTENSITY; X RAY PHOTOEMISSION SPECTROSCOPY;

BINDING ENERGY; BROMINE COMPOUNDS; CHEMICAL ANALYSIS; CHEMICAL BONDS; CHEMICAL STABILITY; CRYSTAL GROWTH FROM MELT; CRYSTAL STRUCTURE; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; LEAD; PHOTOELECTRON SPECTROSCOPY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; RUBIDIUM; SURFACE PROPERTIES; SURFACES; X RAY CRYSTALLOGRAPHY; X RAY PHOTOELECTRON SPECTROSCOPY;

BROMINE;

EID: 84355166481     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2011.10.054     Document Type: Article

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