Atomic force microscopy force-distance curves with small amplitude ultrasonic modulation

Scanning

Volumn 37, Issue 4, 2015, Pages 284-293

  Ma, Chengfu ^a   Chen, Yuhang ^a   Wang, Tian ^a   Chu, Jiaru ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

atomic force microscopy; force spectroscopy; force distance curves; pull off force; ultrasonic modulation

Indexed keywords

GOLD METALLOGRAPHY; MODULATION; NANOCANTILEVERS;

EXCITATION AMPLITUDES; FORCE SPECTROSCOPY; FORCE-DISTANCE CURVES; HIGHLY ORIENTED PYROLYTIC GRAPHITE; OSCILLATION AMPLITUDE; PULL-OFF FORCES; ULTRASONIC MODULATION; ULTRASONIC OSCILLATIONS;

ATOMIC FORCE MICROSCOPY;

GRAPHITE;

AMPLITUDE MODULATION; ARTICLE; ATOMIC FORCE MICROSCOPY; FORCE; HYSTERESIS; MEASUREMENT; OSCILLATION; PRIORITY JOURNAL; SIMULATION; THEORETICAL STUDY;

EID: 84938742942     PISSN: 01610457     EISSN: 19328745     Source Type: Journal    
DOI: 10.1002/sca.21211     Document Type: Article

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