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Journal of Applied Physics

Volumn 117, Issue 23, 2015, Pages

Hard x-ray photoelectron spectroscopy using an environmental cell with silicon nitride membrane windows

(6) Tsunemi, Eika a,b Watanabe, Yoshio a,b,d Oji, Hiroshi c,d Cui, Yi Tao c,e Son, Jin Young c Nakajima, Atsushi a,b

a JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

b KEIO UNIVERSITY (Japan)

c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE (Japan)

d Aichi Science and Technology Foundation 205 3 Minamiyamaguchi cho (Japan)

e UNIVERSITY OF TOKYO (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; CELLS; CYTOLOGY; GAS PERMEABLE MEMBRANES; PHOTOELECTRONS; PHOTONS; SCANNING ELECTRON MICROSCOPY; SILICON NITRIDE;

ELECTRON MEASUREMENTS; ENERGY DISPERSIVE X-RAY SPECTROMETRY; ENVIRONMENTAL CELLS; FLUORESCENT MICROSCOPY; GAS BARRIER PROPERTIES; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; MORPHOLOGICAL PROPERTIES; SILICON NITRIDE MEMBRANE;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84935029491 PISSN: 00218979 EISSN: 10897550 Source Type: Journal
DOI: 10.1063/1.4922335 Document Type: Article

Times cited : (10)

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