A HAXPES measurement system up to 15 keV developed at BL46XU of SPring-8

Journal of Physics: Conference Series

Volumn 502, Issue 1, 2014, Pages

  Oji, H ^a,b   Cui, Y T ^a   Koganezawa, T ^a   Isomura, N ^c   Dohmae, K ^c   Son, J Y ^a,b  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b Hyogo 678 1205   (Japan)

^c Rd Management Section   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; KINETIC ENERGY; KINETICS; PARTICLE BEAMS; PHOTONS;

CHEMICAL STATE ANALYSIS; FERMI EDGE; MEASUREMENT SYSTEM; PHOTON ENERGY; SI WAFER; SIO2 THIN FILMS; SPRING-8; TOTAL ENERGY;

SILICON WAFERS;

EID: 84899634024     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/502/1/012006     Document Type: Conference Paper

References (4)

1. http://www.spring8.or.jp/wkg/BL46XU/instrument/lang-en/INS-0000001484/ instrument-summary-view
2. Rubio-Zuazo J, Escher M, Merkel M and Castro G R 2010 Rev. Sci. Instrum. 81 043304
3. Nonaka T, Dohmae K, Araki T, Hayashi Y, Hirose Y, Uruga T, Yamazaki H, Mochizuki T, Tanida H and Goto S 2012 Rev. Sci. Instrum. 83 083112
4. Ishikawa T, Tamasaku K and Yabashi M 2005 Nucl. Instrum. Method. Phys. Res. A 547 42