Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon

AIP Advances

Volumn 5, Issue 6, 2015, Pages

  Schinke, Carsten ^a   Christian Peest, P ^a   Schmidt, Jan ^a,b   Brendel, Rolf ^a,b   Bothe, Karsten ^a   Vogt, Malte R ^b   Kröger, Ingo ^c   Winter, Stefan ^c   Schirmacher, Alfred ^c   Lim, Siew ^d   Nguyen, Hieu T ^d   Macdonald, Daniel ^d  

^a INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH   (Germany)

^b LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^c PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^d AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; SILICON; SPECTROSCOPIC ELLIPSOMETRY;

ABSORPTION CO-EFFICIENT; CRYSTALLINE SILICONS; GUIDE TO THE EXPRESSION OF UNCERTAINTY IN MEASUREMENTS; LUMINESCENCE MEASUREMENTS; MEASUREMENT METHODS; MEASUREMENT UNCERTAINTY ANALYSIS; RELATIVE UNCERTAINTY; SPECTRAL RESPONSIVITY;

UNCERTAINTY ANALYSIS;

EID: 84933567642     PISSN: None     EISSN: 21583226     Source Type: Journal    
DOI: 10.1063/1.4923379     Document Type: Article

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