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Volumn 2015-January, Issue January, 2014, Pages

Single Event Upset characterization of the Kintex-7 field programmable gate array using proton irradiation

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER CONTROL SYSTEMS; FIELD PROGRAMMABLE GATE ARRAYS (FPGA); PROTON IRRADIATION; RADIATION; RADIATION HARDENING;

EID: 84933055508     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2014.7004593     Document Type: Conference Paper
Times cited : (35)

References (15)
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    • Petersen, E.1
  • 2
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    • Operation of the TRIUMF (20-500MeV) proton irradiation facility
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  • 3
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  • 4
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    • http://www.xilinx.com/support/documentation/sw-manuals/xilinx13-3/is ehelp-start.htm#pim-c-overview.htm
  • 5
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    • http://www.xilinx.com/support/documentation/boards-and-kits/kc705/ug 810-KC705-Eval-Bd.pd
  • 6
    • 84933069558 scopus 로고    scopus 로고
    • http://www.xilinx.com/support/documentation/sw-manuals/xilinx12-1/ch ipscope-pro-sw-cores-ug029.pdf
  • 7
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    • http://www.triumf.ca/pif.
  • 8
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    • Latchup in integrated circuits from energetic protons
    • Dec
    • Johnston, G. Swift, and L. Edmonds, "Latchup in integrated circuits from energetic protons, "IEEE Transactions on Nuclear Science, " Vol. 44, No. 6, pp. 2367-2377, Dec., 1997.
    • (1997) IEEE Transactions on Nuclear Science , vol.44 , Issue.6 , pp. 2367-2377
    • Swift, J.G.1    Edmonds, L.2
  • 9
    • 0031290198 scopus 로고    scopus 로고
    • Risk assessment for heavy ions of parts tested with protons
    • Dec
    • P. O'Neill, G. Badhwar, and W. Culpepper, "Risk Assessment for Heavy Ions of Parts Tested with Protons, " IEEE Transactions on Nuclear Science, Vol. 44, No. 6, pp. 2311-2314 , Dec., 1997.
    • (1997) IEEE Transactions on Nuclear Science , vol.44 , Issue.6 , pp. 2311-2314
    • O'Neill, P.1    Badhwar, G.2    Culpepper, W.3
  • 10
    • 0032216861 scopus 로고    scopus 로고
    • Internuclear cascade evaporation model for LET spectra of 200 MeV protons used for parts testing
    • Dec
    • P. O'Neill, G. Badhwar, and W. Culpepper, "Internuclear cascade evaporation model for LET spectra of 200 MeV protons used for parts testing, " IEEE Transactions on Nuclear Science, Vol. 45, No. 6, pp. 2467-2474, Dec., 1998.
    • (1998) IEEE Transactions on Nuclear Science , vol.45 , Issue.6 , pp. 2467-2474
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  • 11
    • 84870603150 scopus 로고    scopus 로고
    • Single event upset characterization of the Virtex-6 field programmable gate array using proton irradiation
    • D. Hiemstra and V. Kirischian, "Single event upset characterization of the Virtex-6 field programmable gate array using proton irradiation, " IEEE REDW, pp.124-127, 2012.
    • IEEE REDW , vol.2012 , pp. 124-127
    • Hiemstra, D.1    Kirischian, V.2
  • 12
    • 84892145219 scopus 로고    scopus 로고
    • Single event upset characterization of the Viretx-5 field programmable gate array using proton irradiation
    • D. Hiemstra, G. Battiston, P. Gill, "Single event upset characterization of the Viretx-5 field programmable gate array using proton irradiation, " IEEE REDW , pp.4, 20-23, 2010.
    • (2010) IEEE REDW , vol.20-23 , pp. 4
    • Hiemstra, D.1    Battiston, G.2    Gill, P.3
  • 13
    • 44449158299 scopus 로고    scopus 로고
    • Single event upset characterization of the Virtex-4 field programmable gate array using proton irradiation
    • D. Hiemstra, F. Chayab, and Z. Mohammed, "Single event upset characterization of the Virtex-4 field programmable gate array using proton irradiation, " IEEE REDW, pp. 105-108, 2006.
    • (2006) IEEE REDW , pp. 105-108
    • Hiemstra, D.1    Chayab, F.2    Mohammed, Z.3
  • 14
    • 17644365390 scopus 로고    scopus 로고
    • Dynamic single event upset characterization of the Virtex-II and Spartan-3 SRAM field programmable gate arrays using proton irradiation
    • D. Hiemstra, F. Chayab, and L. Szajek, "Dynamic single event upset characterization of the Virtex-II and Spartan-3 SRAM field programmable gate arrays using proton irradiation, " IEEE REDW, pp. 79-84, 2004.
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    • Hiemstra, D.1    Chayab, F.2    Szajek, L.3
  • 15
    • 33749394221 scopus 로고    scopus 로고
    • Part II: Dynamic single event upset characterization of the virtex-II field programmable gate array using proton irradiation
    • D. Hiemstra and F. Chayab, "Part II: Dynamic Single Event Upset Characterization of the Virtex-II Field Programmable Gate Array Using Proton Irradiation, " IEEE REDW, pp.46-50, 2005.
    • (2005) IEEE REDW , pp. 46-50
    • Hiemstra, D.1    Chayab, F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.