-
1
-
-
0032313624
-
The SEU figure of merit and proton upset rate calculations
-
Dec
-
E. Petersen, "The SEU Figure of Merit and Proton Upset Rate Calculations, " IEEE Transactions on Nuclear Science, Vol. 45, No. 6, pp. 2550-2562, Dec., 1998.
-
(1998)
IEEE Transactions on Nuclear Science
, vol.45
, Issue.6
, pp. 2550-2562
-
-
Petersen, E.1
-
2
-
-
0034504425
-
Operation of the TRIUMF (20-500MeV) proton irradiation facility
-
E. Blackmore, "Operation of the TRIUMF (20-500MeV) proton irradiation facility, " IEEE REDW, pp. 1-5, 2000.
-
(2000)
IEEE REDW
, pp. 1-5
-
-
Blackmore, E.1
-
3
-
-
84933069555
-
-
http://www.xilinx.com/support/documentation/data-sheets/ds180-7Series-Overview.pdf
-
-
-
-
4
-
-
84933069556
-
-
http://www.xilinx.com/support/documentation/sw-manuals/xilinx13-3/is ehelp-start.htm#pim-c-overview.htm
-
-
-
-
5
-
-
84933069557
-
-
http://www.xilinx.com/support/documentation/boards-and-kits/kc705/ug 810-KC705-Eval-Bd.pd
-
-
-
-
6
-
-
84933069558
-
-
http://www.xilinx.com/support/documentation/sw-manuals/xilinx12-1/ch ipscope-pro-sw-cores-ug029.pdf
-
-
-
-
7
-
-
84933069559
-
-
http://www.triumf.ca/pif.
-
-
-
-
8
-
-
0031354388
-
Latchup in integrated circuits from energetic protons
-
Dec
-
Johnston, G. Swift, and L. Edmonds, "Latchup in integrated circuits from energetic protons, "IEEE Transactions on Nuclear Science, " Vol. 44, No. 6, pp. 2367-2377, Dec., 1997.
-
(1997)
IEEE Transactions on Nuclear Science
, vol.44
, Issue.6
, pp. 2367-2377
-
-
Swift, J.G.1
Edmonds, L.2
-
9
-
-
0031290198
-
Risk assessment for heavy ions of parts tested with protons
-
Dec
-
P. O'Neill, G. Badhwar, and W. Culpepper, "Risk Assessment for Heavy Ions of Parts Tested with Protons, " IEEE Transactions on Nuclear Science, Vol. 44, No. 6, pp. 2311-2314 , Dec., 1997.
-
(1997)
IEEE Transactions on Nuclear Science
, vol.44
, Issue.6
, pp. 2311-2314
-
-
O'Neill, P.1
Badhwar, G.2
Culpepper, W.3
-
10
-
-
0032216861
-
Internuclear cascade evaporation model for LET spectra of 200 MeV protons used for parts testing
-
Dec
-
P. O'Neill, G. Badhwar, and W. Culpepper, "Internuclear cascade evaporation model for LET spectra of 200 MeV protons used for parts testing, " IEEE Transactions on Nuclear Science, Vol. 45, No. 6, pp. 2467-2474, Dec., 1998.
-
(1998)
IEEE Transactions on Nuclear Science
, vol.45
, Issue.6
, pp. 2467-2474
-
-
O'Neill, P.1
Badhwar, G.2
Culpepper, W.3
-
11
-
-
84870603150
-
Single event upset characterization of the Virtex-6 field programmable gate array using proton irradiation
-
D. Hiemstra and V. Kirischian, "Single event upset characterization of the Virtex-6 field programmable gate array using proton irradiation, " IEEE REDW, pp.124-127, 2012.
-
IEEE REDW
, vol.2012
, pp. 124-127
-
-
Hiemstra, D.1
Kirischian, V.2
-
12
-
-
84892145219
-
Single event upset characterization of the Viretx-5 field programmable gate array using proton irradiation
-
D. Hiemstra, G. Battiston, P. Gill, "Single event upset characterization of the Viretx-5 field programmable gate array using proton irradiation, " IEEE REDW , pp.4, 20-23, 2010.
-
(2010)
IEEE REDW
, vol.20-23
, pp. 4
-
-
Hiemstra, D.1
Battiston, G.2
Gill, P.3
-
13
-
-
44449158299
-
Single event upset characterization of the Virtex-4 field programmable gate array using proton irradiation
-
D. Hiemstra, F. Chayab, and Z. Mohammed, "Single event upset characterization of the Virtex-4 field programmable gate array using proton irradiation, " IEEE REDW, pp. 105-108, 2006.
-
(2006)
IEEE REDW
, pp. 105-108
-
-
Hiemstra, D.1
Chayab, F.2
Mohammed, Z.3
-
14
-
-
17644365390
-
Dynamic single event upset characterization of the Virtex-II and Spartan-3 SRAM field programmable gate arrays using proton irradiation
-
D. Hiemstra, F. Chayab, and L. Szajek, "Dynamic single event upset characterization of the Virtex-II and Spartan-3 SRAM field programmable gate arrays using proton irradiation, " IEEE REDW, pp. 79-84, 2004.
-
(2004)
IEEE REDW
, pp. 79-84
-
-
Hiemstra, D.1
Chayab, F.2
Szajek, L.3
-
15
-
-
33749394221
-
Part II: Dynamic single event upset characterization of the virtex-II field programmable gate array using proton irradiation
-
D. Hiemstra and F. Chayab, "Part II: Dynamic Single Event Upset Characterization of the Virtex-II Field Programmable Gate Array Using Proton Irradiation, " IEEE REDW, pp.46-50, 2005.
-
(2005)
IEEE REDW
, pp. 46-50
-
-
Hiemstra, D.1
Chayab, F.2
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