Part II: Dynamic single event upset characterization of the virtex-II field programmable gate array using proton irradiation

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2005, Pages 46-50

  Hiemstra, David M ^a,b   Chayab, Fayez ^b  

^a IEEE   (Canada)

^b MDA Consulting Limited Canada   (Canada)

Author keywords

Proton irradiation; Single event upset; SRAM FPGA

Indexed keywords

SINGLE EVENT UPSET; SPACE RADIATION;

PRODUCT DESIGN; PROTON IRRADIATION; RADIATION EFFECTS; RANDOM ACCESS STORAGE;

FIELD PROGRAMMABLE GATE ARRAYS;

EID: 33749394221     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2005.1532664     Document Type: Conference Paper

References (8)

1. D. Hiemstra, F. Chayab, and L. Szajek, "Dynamic single event upset characterization of the Virtex-II and Spartan-3 SRAM field programmable gate arrays using proton irradiation," IEEE REDW, pp. 79-84, 2004.
2. E. Petersen, "The SEU Figure of Merit and Proton Upset Rate Calculations," IEEE Transactions on Nuclear Science, Vol. 45, No. 6, pp. 2550-2562, Dec., 1998.
3. E. Blackmore, "Operation of the TRIUMF (20-500MeV) proton irradiation facility," IEEE REDW, pp. 1-5, 2000.
4. http://www.xilinx.com/bvdocs/publications/ds031.pdf
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6. http://www.gaisler.com/products/leon2/leon.html
7. http://www.triumf.ca/pif.
8. K. LaBel and M. Gates, "Single-Event-Effect mitigation from a system perspective," IEEE Transactions on Nuclear Science, Vol. 43, No. 2, pp. 654-600, April, 1996.