Dynamic single event upset characterization of the Virtex-II and Spartan-3 SRAM field programmable gate arrays using proton irradiation

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2004, Pages 79-84

  Hiemstra, David M ^a   Chayab, Fayez ^a   Szajek, Lucas ^a  

^a MD Robotics   (Canada)

Author keywords

Proton irradiation; Single event upset; SRAM FPGA

Indexed keywords

COMPUTER HARDWARE; ERROR ANALYSIS; ESTIMATION; FLIP FLOP CIRCUITS; LIGHT EMITTING DIODES; PERSONAL COMPUTERS; PROTON IRRADIATION; SOFTWARE PROTOTYPING; SPACE APPLICATIONS; STATIC RANDOM ACCESS STORAGE;

SINGLE EVENT UPSET (SEU); SPARTAN-3; UPSET RATES; VIRTEX-II DEVICE;

FIELD PROGRAMMABLE GATE ARRAYS;

EID: 17644365390     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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