4T-Decay Sensors: A New Class of Small, Fast, Robust, and Low-Power, Temperature/Leakage Sensors

Proceedings of the International Symposium on Low Power Electronics and Design

Volumn 2004-January, Issue January, 2004, Pages 108-113

  Kaxiras, Stefanos ^a   Xekalakis, Polychronis ^a  

^a UNIVERSITY OF PATRAS   (Greece)

Author keywords

4T SRAM; Architecture; Leakage; Sensor; Temperature

Indexed keywords

ARCHITECTURE; LEAKAGE (FLUID); LEAKAGE CURRENTS; LOW POWER ELECTRONICS; POWER ELECTRONICS; SENSORS; STATIC RANDOM ACCESS STORAGE; T-CELLS; TEMPERATURE;

4T SRAM; ARCHITECTURAL LEVELS; HIGH TEMPERATURE; INNOVATIVE IDEAS; MEASUREMENT RELIABILITIES; ON-CHIP TEMPERATURE; POWER EFFICIENT; PROCESS VARIATION;

DESIGN;

EID: 84932143485     PISSN: 15334678     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/LPE.2004.240811     Document Type: Conference Paper

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