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Volumn 23, Issue 7, 2015, Pages 838-846

Direct evidence of enhanced chlorine segregation at grain boundaries in polycrystalline CdTe thin films via three-dimensional TOF-SIMS imaging

Author keywords

CdCl2; CdTe; defect passivation; grain boundary; passivation; segregation

Indexed keywords

CADMIUM CHLORIDE; CADMIUM TELLURIDE; CHLORINE; DEPTH PROFILING; FREE ENERGY; GRAIN BOUNDARIES; II-VI SEMICONDUCTORS; INDUSTRIAL RESEARCH; PASSIVATION; SECONDARY ION MASS SPECTROMETRY; SEGREGATION (METALLOGRAPHY); SOLAR CELLS; SPATIAL DISTRIBUTION;

EID: 84931569077     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.2498     Document Type: Article
Times cited : (56)

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