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Volumn 82, Issue 1-2, 2004, Pages 279-290

Spectroscopic ellipsometry investigation of optical and interface properties of CdTe films deposited on metal foils

Author keywords

CdTe; Electrodeposition; Ellipsometry; Flexible substrate

Indexed keywords

ELECTRODEPOSITION; ELLIPSOMETRY; INTERFACES (MATERIALS); METAL FOIL; MULTILAYERS; NUCLEATION; REFRACTIVE INDEX; SINGLE CRYSTALS;

EID: 1942505284     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2004.01.025     Document Type: Conference Paper
Times cited : (36)

References (12)
  • 8
    • 1942456288 scopus 로고    scopus 로고
    • US Patent No. 5,796, 983, issued August 18, Dielectric Function Parametric Model and Method of Use
    • C.M. Herzinger, B. Johs, US Patent No. 5,796, 983, issued August 18, 1998, Dielectric Function Parametric Model and Method of Use.
    • (1998)
    • Herzinger, C.M.1    Johs, B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.