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Volumn 82, Issue 1-2, 2004, Pages 279-290
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Spectroscopic ellipsometry investigation of optical and interface properties of CdTe films deposited on metal foils
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Author keywords
CdTe; Electrodeposition; Ellipsometry; Flexible substrate
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Indexed keywords
ELECTRODEPOSITION;
ELLIPSOMETRY;
INTERFACES (MATERIALS);
METAL FOIL;
MULTILAYERS;
NUCLEATION;
REFRACTIVE INDEX;
SINGLE CRYSTALS;
FLEXIBLE SUBSTRATES;
SEMICONDUCTING CADMIUM TELLURIDE;
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EID: 1942505284
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.solmat.2004.01.025 Document Type: Conference Paper |
Times cited : (36)
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References (12)
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