Minority carrier lifetime analysis in the bulk of thin-film absorbers using subbandgap (Two-Photon) excitation

IEEE Journal of Photovoltaics

Volumn 3, Issue 4, 2013, Pages 1319-1324

  Kuciauskas, Darius ^a   Kanevce, Ana ^a   Burst, James M ^a   Duenow, Joel N ^a   Dhere, Ramesh ^a   Albin, David S ^a   Levi, Dean H ^a   Ahrenkiel, Richard K ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

Cadmium telluride; minority carrier lifetime; photovoltaic (PV) device; time resolved photoluminescence (TRPL)

Indexed keywords

MINORITY CARRIER LIFETIMES; ONE-PHOTON EXCITATION; PHOTOVOLTAIC; SEMICONDUCTOR ABSORBERS; SURFACE RECOMBINATION VELOCITIES; THIN-FILM ABSORBERS; TIME-RESOLVED PHOTOLUMINESCENCE; TWO-PHOTON EXCITATIONS;

CADMIUM TELLURIDE; CARRIER LIFETIME; PHOTOLUMINESCENCE;

PHOTONS;

EID: 84884596301     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2013.2270354     Document Type: Article

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