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Volumn 48, Issue , 2015, Pages 747-757

A look-up table based approach to characterize crystal twinning for synchrotron X-ray Laue microdiffraction scans

Author keywords

crystal orientation maps; look up tables; synchrotron X ray Laue microdiffraction; twinning

Indexed keywords

CRYSTAL SYMMETRY; DIFFRACTION; DISTANCE MEASUREMENT; MOBILE DEVICES; TABLE LOOKUP; TWINNING;

EID: 84930656299     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S1600576715004896     Document Type: Article
Times cited : (18)

References (47)
  • 3
    • 84930635089 scopus 로고    scopus 로고
    • Sandia National Laboratories, Albuquerque, NM, USA
    • Brannon, R. M. (2002). Report NM 87185-0820. Sandia National Laboratories, Albuquerque, NM, USA.
    • (2002) Report NM 87185-0820
    • Brannon, R.M.1
  • 7
  • 22
    • 41549122789 scopus 로고    scopus 로고
    • edited by F. R. N. Nabarro & J. P. Hirth Amsterdam: Elsevier
    • Ice, G. E. & Barabash, R. I. (2007). Dislocations in Solids, Vol. 13, edited by F. R. N. Nabarro & J. P. Hirth, pp. 499-601. Amsterdam: Elsevier.
    • (2007) Dislocations in Solids , vol.13 , pp. 499-601
    • Ice, G.E.1    Barabash, R.I.2
  • 24
    • 29444455135 scopus 로고    scopus 로고
    • edited by E. Prince. Dordrecht: Kluwer Academic Publishers
    • Koch, E. (2004). International Tables for Crystallography, Vol. C, edited by E. Prince. Dordrecht: Kluwer Academic Publishers.
    • (2004) International Tables for Crystallography , vol.C
    • Koch, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.