Evidence for flat bands near the Fermi level in epitaxial rhombohedral multilayer graphene

ACS Nano

Volumn 9, Issue 5, 2015, Pages 5432-5439

  Pierucci, Debora ^a   Sediri, Haikel ^a   Hajlaoui, Mahdi ^a,b   Girard, Jean Christophe ^a   Brumme, Thomas ^c   Calandra, Matteo ^c   Velez Fort, Emilio ^a,c   Patriarche, Gilles ^a   Silly, Mathieu G ^b   Ferro, Gabriel ^d   Soulière, Véronique ^d   Marangolo, Massimiliano ^e   Sirotti, Fausto ^b   Mauri, Francesco ^c   Ouerghi, Abdelkarim ^a  

^a UNIV PARIS SUD   (France)

^b SYNCHROTRON SOLEIL   (France)

^c UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

^d UNIVERSITÉ CLAUDE BERNARD LYON 1   (France)

^e INSTITUT DES NANOSCIENCES DE PARIS   (France)

Author keywords

angle resolved photoemission spectroscopy; density functional theory; flat band; rhombohedral multilayer graphene; STEM; STM STS

Indexed keywords

CHARGE DENSITY; CHARGE DENSITY WAVES; ELECTRON CORRELATIONS; ELECTRONIC PROPERTIES; FERMI LEVEL; GRAPHENE; MULTILAYERS; PHOTOELECTRON SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SILICON CARBIDE;

ANGLE RESOLVED PHOTOEMISSION SPECTROSCOPY; FLAT BAND; MULTILAYER GRAPHENE; STEM; STM/STS;

DENSITY FUNCTIONAL THEORY;

EID: 84930651317     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/acsnano.5b01239     Document Type: Article

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