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Volumn 7, Issue 17, 2015, Pages 8135-8141

Layer number identification of intrinsic and defective multilayered graphenes up to 100 layers by the Raman mode intensity from substrates

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTAL ORIENTATION; DEFECTS; DIELECTRIC MATERIALS; GRAPHENE; LASER EXCITATION; LOW-K DIELECTRIC; RAMAN SPECTROSCOPY; SILICA; SUBSTRATES;

EID: 84929484536     PISSN: 20403364     EISSN: 20403372     Source Type: Journal    
DOI: 10.1039/c5nr01514f     Document Type: Article
Times cited : (83)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.