The numerical-aperture-dependent optical contrast and thickness determination of ultrathin flakes of two-dimensional atomic crystals: A case of graphene multilayers

Wuli Xuebao/Acta Physica Sinica

Volumn 62, Issue 11, 2013, Pages

  Han, Wen Peng ^a   Shi, Yan Meng ^a   Li, Xiao Li ^a   Luo, Shi Qiang ^a   Lu, Yan ^a   Tan, Ping Heng ^a  

^a INSTITUTE OF SEMICONDUCTORS   (China)

Author keywords

Multilayer; Optical contrast; The transfer matrix; Two dimensional atomic crystals

Indexed keywords

ATOMIC CRYSTALS; GRAPHENE MULTILAYERS; MICROSCOPE OBJECTIVE; MULTILAYER DIELECTRIC SUBSTRATES; OPTICAL AND ELECTRONIC PROPERTIES; OPTICAL CONTRAST; RESEARCH AND APPLICATION; THICKNESS DETERMINATION;

ATOMS; DIFFRACTION; ELECTRONIC PROPERTIES; GRAPHENE; LIGHT SOURCES; MULTILAYERS; TRANSFER MATRIX METHOD; TWO DIMENSIONAL;

OPTICAL MULTILAYERS;

EID: 84879878389     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: 10.7498/aps.62.110702     Document Type: Article

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