On classification with bags, groups and sets

Pattern Recognition Letters

Volumn 59, Issue , 2015, Pages 11-17

  Cheplygina, Veronika ^a   Tax, David M J ^a   Loog, Marco ^a,b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF COPENHAGEN   (Denmark)

Author keywords

Group based classification; Label dependencies; Multiple instance learning; Set classification; Weakly labeled data

Indexed keywords

SOFTWARE ENGINEERING;

GROUP-BASED; INDIVIDUAL FEATURES; LABEL DEPENDENCIES; LEARNING SCENARIOS; MULTIPLE INSTANCE LEARNING; SETS OF FEATURES; TEST OBJECT; TEST SAMPLES;

PATTERN RECOGNITION;

EID: 84929000252     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patrec.2015.03.008     Document Type: Article

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