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Volumn 4212 LNAI, Issue , 2006, Pages 449-460

Batch classification with applications in computer aided diagnosis

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED ANALYSIS; COMPUTER AIDED DIAGNOSIS; DATABASE SYSTEMS; LEARNING ALGORITHMS; PROBABILITY; PROGRAM DIAGNOSTICS;

EID: 33750304254     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/11871842_43     Document Type: Conference Paper
Times cited : (6)

References (9)
  • 2
    • 0002709342 scopus 로고    scopus 로고
    • Feature selection via concave minimization and support vector machines
    • San Francisco, CA, Morgan Kaufmann
    • P. S. Bradley and O. L. Mangasarian. Feature selection via concave minimization and support vector machines. In Proc. 15th International Conf. on Machine Learning, pages 82-90, San Francisco, CA, 1998. Morgan Kaufmann.
    • (1998) Proc. 15th International Conf. on Machine Learning , pp. 82-90
    • Bradley, P.S.1    Mangasarian, O.L.2
  • 4
    • 0142192295 scopus 로고    scopus 로고
    • Conditional random fields: Probabilistic models for segmenting and labeling sequence data
    • San Francisco, CA, Morgan Kaufmann
    • J. Lafferty, A. McCallum, and F. Pereira. Conditional random fields: Probabilistic models for segmenting and labeling sequence data. In Proc. 18th International Conf. on Machine Learning, pages 282-289, San Francisco, CA, 2001. Morgan Kaufmann.
    • (2001) Proc. 18th International Conf. on Machine Learning , pp. 282-289
    • Lafferty, J.1    McCallum, A.2    Pereira, F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.