Strong red emission and electrical properties of highly c-axis oriented Eu3+-doped bismuth vanadate ferroelectric thin films

Materials Chemistry and Physics

Volumn 148, Issue 3, 2014, Pages 854-858

  Xie, Wei ^a   Su, Li ^a   Sa, Tongliang ^a   Fu, Jianhui ^a   Hu, Wei ^a   Qin, Ni ^a   Bao, Dinghua ^a  

^a SUN YAT SEN UNIVERSITY   (China)

Author keywords

Chemical synthesis; Dielectric properties; Ferroelectricity; Luminescence; Thin films

Indexed keywords

DEPOSITION; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES; EMISSION SPECTROSCOPY; FERROELECTRIC THIN FILMS; FERROELECTRICITY; FUSED SILICA; LUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DOPING; SYNTHESIS (CHEMICAL); THIN FILMS; TITANIUM; X RAY DIFFRACTION;

BISMUTH VANADATES; CHEMICAL SOLUTION DEPOSITION METHOD; ELECTRICAL MEASUREMENT; EMISSION SPECTRUMS; FUSED SILICA SUBSTRATES; MULTI-FUNCTIONAL MATERIALS; RED PHOTOLUMINESCENCE; STRONG RED EMISSIONS;

FERROELECTRIC FILMS;

EID: 84927598166     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2014.08.061     Document Type: Article

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