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Volumn 15, Issue 4, 2015, Pages 2627-2632

Nanoscale Electrostatic Control of Oxide Interfaces

Author keywords

nanoelectronics; Oxide interfaces; split gates; superconducting weak link; top gating

Indexed keywords

LEAKAGE CURRENTS; NANOELECTRONICS; NANOTECHNOLOGY; THRESHOLD VOLTAGE;

EID: 84926679011     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/acs.nanolett.5b00216     Document Type: Review
Times cited : (50)

References (37)
  • 1
    • 22044436405 scopus 로고    scopus 로고
    • Dagotto, E. Science 2005, 309, 257 - 262
    • (2005) Science , vol.309 , pp. 257-262
    • Dagotto, E.1
  • 15


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.