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Volumn 6, Issue 6, 2011, Pages 343-347

Sketched oxide single-electron transistor

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DATA STORAGE EQUIPMENT; ELECTRODES; ELECTRONS; FIELD EFFECT TRANSISTORS; METAL INSULATOR BOUNDARIES; METAL INSULATOR TRANSITION; QUANTUM OPTICS; REFRACTORY METAL COMPOUNDS; SEMICONDUCTOR INSULATOR BOUNDARIES; SIMULATION PLATFORM;

EID: 85027919594     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2011.56     Document Type: Article
Times cited : (144)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.