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Volumn 23, Issue 42, 2013, Pages 5240-5248

Defect engineering in oxide heterostructures by enhanced oxygen surface exchange

Author keywords

defect engineering; electron gas; interfaces; mobility; oxide heterostructures

Indexed keywords

CONDUCTING INTERFACE; DEFECT ENGINEERING; DEVICE TECHNOLOGIES; ELECTRICAL TRANSPORT PROPERTIES; HIGH CARRIER MOBILITY; IMPURITY SCATTERING; OXIDE HETEROSTRUCTURES; OXYGEN SURFACE EXCHANGE;

EID: 84887821580     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.201203355     Document Type: Article
Times cited : (105)

References (38)
  • 28
    • 84887823743 scopus 로고    scopus 로고
    • A. McCollam, S. Wenderich, M. K. Kruize, V. K. Guduru, H. J. A. Molegraaf, M. Huijben, G. Koster, D. H. A. Blank, G. Rijnders, A. Brinkman, H. Hilgenkamp, U. Zeitler, J. C. Maan, 2012, arXiv:1207.7003
    • A. McCollam, S. Wenderich, M. K. Kruize, V. K. Guduru, H. J. A. Molegraaf, M. Huijben, G. Koster, D. H. A. Blank, G. Rijnders, A. Brinkman, H. Hilgenkamp, U. Zeitler, J. C. Maan, 2012, arXiv:1207.7003.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.