Localized conductive patterning via focused electron beam reduction of graphene oxide

Applied Physics Letters

Volumn 106, Issue 13, 2015, Pages

  Kim, Songkil ^a   Kulkarni, Dhaval D ^b   Henry, Mathias ^a   Zackowski, Paul ^b   Jang, Seung Soon ^b   Tsukruk, Vladimir V ^b   Fedorov, Andrei G ^a,c  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b Georgia Institute of Technology   (United States)

^c GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; DENSITY FUNCTIONAL THEORY; DRAIN CURRENT; ELECTRON BEAMS; ELECTRONIC PROPERTIES; ELECTRONS; MOLECULES; NANOTECHNOLOGY;

DRAIN-SOURCE CURRENTS; ELECTRICAL CONDUCTIVITY; FOCUSED ELECTRON BEAM INDUCED DEPOSITION; FOCUSED ELECTRON BEAMS; HYDROCARBON MOLECULES; NANOSCALE LITHOGRAPHY; PATTERNING TECHNIQUES; REACTIVE INTERMEDIATE;

GRAPHENE;

EID: 84926656107     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4917038     Document Type: Article

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