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Volumn 580, Issue , 2015, Pages 101-105

Moisture barrier evaluation of SiOx/SiNx stacks on polyimide substrates using electrical calcium test

Author keywords

Plasma enhanced chemical vapor deposition; Polyimide; Silicon nitride; Silicon oxide; Water vapor transmission rate

Indexed keywords

FLEXIBLE ELECTRONICS; MOISTURE; NITRIDES; OXIDE FILMS; PLASMA CVD; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; POLYIMIDES; SILICON NITRIDE; SILICON OXIDES; STRUCTURAL OPTIMIZATION; SUBSTRATES; TRANSMISSIONS; WATER VAPOR;

EID: 84926186415     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2015.02.023     Document Type: Article
Times cited : (39)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.