Optical Detection in a Waveguide Geometry with a Single Metallic Contact

ACS Photonics

Volumn 1, Issue 11, 2014, Pages 1089-1092

  Ishii, Satoshi ^a,c   Inoue, Shin Ichiro ^a,b   Ueda, Rieko ^a   Otomo, Akira ^a  

^a NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Hot carrier; internal photoemission; metal thin film; optical waveguide

Indexed keywords

HOT CARRIERS; INFRARED DEVICES; METAL INSULATOR BOUNDARIES; OPTICAL WAVEGUIDES;

COMPACT STRUCTURES; INTERNAL PHOTOEMISSION; METAL THIN FILM; METAL-INSULATOR-METAL STRUCTURES; METALLIC CONTACTS; METALLIC LAYERS; OPTICAL DETECTION; WAVEGUIDE GEOMETRY;

WAVEGUIDES;

EID: 84925860817     PISSN: None     EISSN: 23304022     Source Type: Journal    
DOI: 10.1021/ph500131v     Document Type: Article

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