Ptychographic microscope for three-dimensional imaging

Optics Express

Volumn 22, Issue 10, 2014, Pages 12513-12523

  Godden, T M ^a   Suman, R ^a,b   Humphry, M J ^a   Rodenburg, J M ^a,c   Maiden, A M ^c  

^a Electric Works   (United Kingdom)

^b UNIVERSITY OF YORK   (United Kingdom)

^c UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES;

AXIAL DIRECTION; AXIAL SECTIONS; COHERENT BEAMS; MICRON-SCALE RESOLUTION; OPTICAL SECTIONING; PHASE CONTRASTS; THREE DIMENSIONAL IMAGING; VISIBLE LIGHT;

SKIN;

EID: 84901253121     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.22.012513     Document Type: Article

References (25)

1. J. Marrison, L. Raty, P. Marriott, and P. O'Toole, "Ptychography a label free, high-contrast imaging technique for live cells using quantitative phase information", Nature Scientific Reports 3, 1-7 (2013).
2. H. M. L. Faulkner and J. M. Rodenburg, "Movable aperture lensless transmission microscopy: a novel phase retrieval algorithm", Phys. Rev. Lett. 93, 023903 (2004).
3. P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, "High-resolution scanning x-ray diffraction microscopy", Science 321, 379-382 (2008).
4. M. J. Humphry, B. Kraus, A. C. Hurst, A. M. Maiden, and J. M. Rodenburg, "Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging", Nature Comms. 3, 730 (2012).
5. M. Guizar-Sicairos and J. R. Fienup, "Phase retrieval with transverse translation diversity: a nonlinear optimization approach", Opt. Express 16, 7264-7278 (2008).
6. A. M. Maiden and J. M. Rodenburg, "An improved ptychographical phase retrieval algorithm for diffractive imaging", Ultramicroscopy 109, 1256-1262 (2009).
7. A. M. Maiden, M. J. Humphry, F. Zhang, and J. M. Rodenburg, "Superresolution imaging via ptychography", J. Opt. Soc. Am. A 28, 604-612 (2011).
8. P. Thibault and A. Menzel, "Reconstructing state mixtures from diffraction measurements", Nature 494, 68-71 (2013).
9. P. Thibault and M. Guizar-Sicairos, "Maximum-likelihood refinement for coherent diffractive imaging", New J. Phys 14, 063004 (2012).
10. H. Liu, Z. Xu, X. Zhang, Y. Wu, Z. Guo, and R. Tai, "Effects of missing low-frequency information on ptychographic and plane-wave coherent diffraction imaging", Applied Optics 52, 2416-2427 (2013).
11. D. J. Batey, D. Claus, and J. M. Rodenburg, "Information multiplexing in ptychography", Ultramicroscopy 138, 13-21 (2014).
12. A. M. Maiden, M. J. Humphry, M. C. Sarahan, B. Kraus, and J. M Rodenburg, "An annealing algorithm to correct positioning errors in ptychography", Ultramicroscopy 120, 64-72 (2012).
13. M. Beckers, T. Senkbeil, T. Gorniak, K. Giewekemeyer, T. Salditt, and A. Rosenhahn, "Drift correction in ptychographic diffractive imaging", Ultramicroscopy 126, 44-47 (2013).
14. F. Zhang, I. Peterson, J. Vila-Comamala, A. Diaz, F. Berenguer, R. Bean, B. Chen, A. Menzel, I. K. Robinson, and J. M. Rodenburg, "Translation position determination in ptychographic coherent diffractive imaging", Opt. Express 21, 13592-13606 (2013).
15. A. Tripathi, I. McNulty, and O. G. Shpyrko, "Ptychographic overlap constraint errors and the limits of their numerical recovery using conjugate gradient descent methods", Opt. Express 22(2), 1452-1466 (2014).
16. P. Thibault, V. Elser, C. Jacobsen, D. Shapiro, and D. Sayre, "Reconstruction of a yeast cell from X-ray diffraction data", Acta Crystallogr. Sec. A 62, 248-261 (2006).
17. A. M. Maiden, M. J. Humphry, and J. M. Rodenburg, "Ptychographic transmission microscopy in three dimensions using a multi-slice approach", J. Opt. Soc. Am. A 29, 1606-1614, (2012).
18. A. Suzuki, S. Furutaku, K. Shimomura, K. Yamauchi, Y. Kohmura, T. Ishikawa, and Y. Takahashi, "Highresolution multislice x-ray ptychography of extended thick objects", Phys. Rev. Lett. 112, 053903 (2014).
19. M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, "Ptychographic x-ray computed tomography at the nanoscale", Nature 467, 436-440 (2010).
20. Y. Cotte, F. Toy, P. Jourdain, N. Pavillon, D. Boss, P. Magistretti, P. Marquet, and C. Depeursinge, "Marker-free phase nanoscopy", Nature Photonics 7, 113-117 (2013).
21. J. M. Rodenburg and R. H. T. Bates, "The theory of super-resolution electron microscopy via Wigner-distribution deconvolution", Phil. Trans. R. Soc. Lond. A 339, 521 (1992).
22. J. M. Cowley and A. F. Moodie, "The scattering of electrons by atoms and crystals. A new theoretical approach", Acta Crystallogr. Sec. A 10, 609-619 (1957).
23. J. W. Goodman, Introduction to Fourier Optics 3rd edition (Roberts and Company Publishers, 2005) pp. 55-73
24. M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Konig, O. Bunk, and F. Pfeiffer, "Ptychographic coherent diffractive imaging of weakly scattering specimens", New J. Phys. 12, 035017 (2010).
25. C. L. Wenzel, J. Marrison, J. Mattsson, J. Haseloff, and S. M. Bougourd, "Ectopic divisions in vascular and ground tissues of Arabidopsis Thaliana result in distinct leaf venation defects", J. Exp. Bot. 63, 5351-5363 (2012).