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Volumn 26, Issue 10, 2015, Pages

High-resolution AFM in liquid: What about the tip?

(1) Voïtchovsky, Kislon a

a DURHAM UNIVERSITY (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY;

AFM IN LIQUID; CHEMICAL NATURE; HIGH RESOLUTION; HIGH RESOLUTION IMAGE; HIGH-RESOLUTION MEASUREMENTS; MEASUREMENT PROCESS; NANOMETRES; NANOSCALE TIP;

NANOTECHNOLOGY;

EID: 84923765886 PISSN: 09574484 EISSN: 13616528 Source Type: Journal
DOI: 10.1088/0957-4484/26/10/100501 Document Type: Review

Times cited : (13)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.