Optical properties of epitaxial BiFeO3 thin film grown on SrRuO3-buffered SrTiO3 substrate

Nanoscale Research Letters

Volumn 9, Issue 1, 2014, Pages 1-6

  Xu, Ji Ping ^a   Zhang, Rong Jun ^a   Chen, Zhi Hui ^a   Wang, Zi Yi ^a   Zhang, Fan ^a   Yu, Xiang ^a   Jiang, An Quan ^a   Zheng, Yu Xiang ^a   Wang, Song You ^a   Chen, Liang Yao ^a  

^a FUDAN UNIVERSITY   (China)

Author keywords

BiFeO3 thin film; Dielectric function; Lorentz model; Optical properties; Spectroscopic ellipsometry

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; ELLIPSOMETRY; ENERGY GAP; EPITAXIAL GROWTH; OPTICAL PROPERTIES; PULSED LASER DEPOSITION; SINGLE CRYSTALS; SPECTROSCOPIC ELLIPSOMETRY; STRONTIUM ALLOYS; STRONTIUM TITANATES; SUBSTRATES; X RAY DIFFRACTION;

BANDGAP TRANSITION; DIELECTRIC FUNCTIONS; ELLIPSOMETRIC SPECTRA; EPITAXIAL STRUCTURE; IN-PLANE COMPRESSIVE STRAIN; LORENTZ MODEL; OPTICAL MODELING; PHOTON ENERGY RANGE;

THIN FILMS;

EID: 84922813839     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1186/1556-276X-9-188     Document Type: Article

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