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Volumn 81, Issue 1, 2015, Pages 167-173

High-quality graphene on single crystal Ir(111) films on Si(111) wafers: Synthesis and multi-spectroscopic characterization

(17)  Struzzi, C a   Verbitskiy, N I b,c,d   Fedorov, A V d,e,f   Nefedov, A g   Frank, O h   Kalbac, M h   Di Santo, G a   Panighel, M a,i   Goldoni, A a   Gartner J j   Weber, W j   Weinl, M k   Schreck, M k   Woll Ch g   Sachdev, H l   Gruneis A d,e   Petaccia, L a  


Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CHEMICAL VAPOR DEPOSITION; ELECTRON SPECTROSCOPY; ELECTRONS; FILM PREPARATION; IRIDIUM; LOW ENERGY ELECTRON DIFFRACTION; PHOTOELECTRON SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SILICON; SILICON WAFERS; SINGLE CRYSTALS; SUBSTRATES; X RAY ABSORPTION; X RAY PHOTOELECTRON SPECTROSCOPY; YTTRIA STABILIZED ZIRCONIA; ZIRCONIA;

EID: 84922688397     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2014.09.045     Document Type: Article
Times cited : (10)

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