EM algorithm for one-shot device testing with competing risks under exponential distribution

Reliability Engineering and System Safety

Volumn 137, Issue , 2015, Pages 129-140

  Balakrishnan, N ^a   So, H Y ^a   Ling, M H ^b  

^a MCMASTER UNIVERSITY   (Canada)

^b THE EDUCATION UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Competing risks; ED01 Data; EM algorithm; Exponential distribution; Inequality constrained least squares; Masked data; One shot device

Indexed keywords

INFERENCE ENGINES; INTELLIGENT SYSTEMS; LEAST SQUARES APPROXIMATIONS; MAXIMUM PRINCIPLE; MONTE CARLO METHODS; RISK ASSESSMENT; TESTING;

COMPETING RISKS; CONSTRAINED LEAST SQUARES; ED01 DATA; EM ALGORITHMS; EXPONENTIAL DISTRIBUTIONS; MASKED DATA; ONE-SHOT DEVICE;

ALGORITHMS;

EID: 84922507907     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ress.2014.12.014     Document Type: Article

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