A bayesian zero-failure reliability demonstrationtest of highquality electro-explosive devices

Quality and Reliability Engineering International

Volumn 25, Issue 8, 2009, Pages 913-920

  Fan, Tsai Hung ^a   Chang, Chia Chen ^a  

^a NATIONAL CENTRAL UNIVERSITY   (Taiwan)

Author keywords

Accelerated experiment; Bayesian reliability demonstration test; Minimum sample size and testing length; Zero failure reliability

Indexed keywords

BAYESIAN; RELIABILITY DEMONSTRATION; SAMPLE SIZES; ZERO-FAILURE RELIABILITY;

BAYESIAN NETWORKS; DEMONSTRATIONS; EXPERIMENTS; EXPLOSIVES; PROBABILITY; RELIABILITY; SENSITIVITY ANALYSIS;

STATISTICAL TESTS;

EID: 73449112631     PISSN: 07488017     EISSN: 10991638     Source Type: Journal    
DOI: 10.1002/qre.1009     Document Type: Article

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