Expectation maximization algorithm for one shot device accelerated life testing with weibull lifetimes, and variable parameters over stress

IEEE Transactions on Reliability

Volumn 62, Issue 2, 2013, Pages 537-551

  Balakrishnan, N ^a,b   Ling, M H ^c  

^a MCMASTER UNIVERSITY   (Canada)

^b KING ABDULAZIZ UNIVERSITY   (Saudi Arabia)

^c CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Accelerated life test; asymptotic confidence intervals; asymptotic estimate; binary data; carcinogenic; coverage probability; destructive testing; EM algorithm; Fisher scoring method; least squares estimate; log linear link function; one shot device testing; parametric bootstrap; sacrifice data; survival data; transformation approach; Weibull distribution

Indexed keywords

ASYMPTOTIC ESTIMATES; BINARY DATA; CARCINOGENIC; CONFIDENCE INTERVAL; COVERAGE PROBABILITIES; DESTRUCTIVE TESTING; DEVICE TESTING; EM ALGORITHMS; LEAST SQUARE; LIFE-TESTS; LINK FUNCTIONS; PARAMETRIC BOOTSTRAP; SACRIFICE DATA; SCORING METHODS; SURVIVAL DATA; TRANSFORMATION APPROACH;

ALGORITHMS; ESTIMATION; LEAST SQUARES APPROXIMATIONS; LINEAR TRANSFORMATIONS; MATHEMATICAL TRANSFORMATIONS; MAXIMUM LIKELIHOOD ESTIMATION; METADATA; RELIABILITY ANALYSIS; STATISTICAL METHODS; TESTING; TUMORS;

WEIBULL DISTRIBUTION;

EID: 84878789167     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2013.2257054     Document Type: Article

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