Quantitative determination of ligand densities on nanomaterials by X-ray photoelectron spectroscopy

ACS Applied Materials and Interfaces

Volumn 7, Issue 3, 2015, Pages 1720-1725

  Torelli, Marco D ^a   Putans, Rebecca A ^a,c   Tan, Yizheng ^a,d   Lohse, Samuel E ^b,e   Murphy, Catherine J ^b   Hamers, Robert J ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^c 3M COMPANY   (United States)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^e and Mass Communication   (United States)

Author keywords

ligand density; molecular coverage; nanoparticle; quantitative XPS

Indexed keywords

COMPUTATIONAL METHODS; GOLD; LIGANDS; NANOPARTICLES; NANOSTRUCTURED MATERIALS; PHOTOELECTRONS; PHOTONS;

COMPUTATIONAL ANALYSIS; CORE-SHELL NANOPARTICLES; ELECTRON ATTENUATION LENGTHS; LIGAND DENSITY; MOLECULAR COVERAGE; QUANTITATIVE CHARACTERIZATION; QUANTITATIVE DETERMINATIONS; XPS QUANTITATIVE ANALYSIS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84921759383     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am507300x     Document Type: Article

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