Incorporation of surface topography in the XPS analysis of curved or rough samples covered by thin multilayers

Surface and Interface Analysis

Volumn 25, Issue 10, 1997, Pages 741-746

  Chatelier, Ronald C ^a   St John, Heather A W ^a   Gengenbach, Thomas R ^a   Kingshott, Peter ^a   Griesser, Hans J ^a  

^a CSIRO   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CURVATURE; GLOBAL ANALYSIS; SURFACE TOPOGRAPHY;

ATOMIC FORCE MICROSCOPY; COATINGS; MULTILAYERS; SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE ROUGHNESS;

EID: 0031235074     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199709)25:10<741::AID-SIA295>3.0.CO;2-#     Document Type: Article

References (20)