Self-referenced composite Fabry-Pérot cavity vapor sensors

Optics Express

Volumn 20, Issue 2, 2012, Pages 966-971

  Reddy, Karthik ^a   Fan, Xudong ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NANOCOMPOSITE FILMS; POLYMERS; REFRACTIVE INDEX; SEMICONDUCTING SILICON COMPOUNDS; SENSORS; SILICON WAFERS; WELLS;

ANALYTES; CHANGE IN THICKNESS; CMOS IMAGERS; DETECTION SCHEME; INCIDENT ANGLES; LIGHT INCIDENT; POLYMER LAYERS; POLYMER THICKNESS; PRECISE MEASUREMENTS; REFLECTED LIGHT; SENSITIVE POLYMERS; VAPOR DETECTION; VAPOR SENSORS;

VAPORS;

POLYMER; SILICON;

AIR; ARTICLE; CHEMISTRY; ELECTRONICS; GAS; GAS CHROMATOGRAPHY; INSTRUMENTATION; METHODOLOGY; MICROFLUIDIC ANALYSIS; REFRACTOMETRY; REPRODUCIBILITY; STANDARD; THEORETICAL MODEL;

AIR; CHROMATOGRAPHY, GAS; GASES; MICROFLUIDIC ANALYTICAL TECHNIQUES; MINIATURIZATION; MODELS, THEORETICAL; POLYMERS; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SILICON;

EID: 84855974966     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.000966     Document Type: Article

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