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Volumn 20, Issue 20, 2012, Pages 22208-22223

The effect of silicon loss and fabrication tolerance on spectral properties of porous silicon Fabry-Perot cavities in sensing applications

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMOBILE MANUFACTURE; CHEMICAL DETECTION; FABRY-PEROT INTERFEROMETERS; POROUS SILICON; REFLECTION; REFRACTIVE INDEX; RESONANCE;

EID: 84866694751     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.022208     Document Type: Article
Times cited : (26)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.