Effect of substrate morphology slope distributions on light scattering, nc-Si:H film growth, and solar cell performance

ACS Applied Materials and Interfaces

Volumn 6, Issue 24, 2014, Pages 22061-22068

  Kim, Do Yun ^a   Santbergen, Rudi ^a   Jäger, Klaus ^a   Sever, Martin ^b   Krč, Janez ^b   Topič, Marko ^b   Hänni, Simon ^c   Zhang, Chao ^d   Heidt, Anna ^d   Meier, Matthias ^d   Van Swaaij, René A C M M ^a   Zeman, Miro ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF LJUBLJANA   (Slovenia)

^c EPFL   (Switzerland)

^d FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

defective layer; film growth; light scattering; nc Si:H; solar cell; surface morphology

Indexed keywords

FILM GROWTH; II-VI SEMICONDUCTORS; LIGHT SCATTERING; METALLIC FILMS; MORPHOLOGY; NANOCRYSTALLINE SILICON; NANOCRYSTALS; OXIDE MINERALS; PLASMA APPLICATIONS; SOLAR CELLS; SUBSTRATES; SURFACE MORPHOLOGY; TEXTURES; THIN FILM SOLAR CELLS; THIN FILMS; WET ETCHING; ZINC OXIDE;

CORRELATION LENGTHS; CRYSTALLINE FRACTIONS; DEFECTIVE LAYERS; HYDROGENATED NANOCRYSTALLINE SILICON (NC-SI:H); NC-SI:H; SOLAR CELL PERFORMANCE; SUBSTRATE MORPHOLOGIES; THIN-FILM SILICON SOLAR CELLS;

SILICON SOLAR CELLS;

EID: 84919904239     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am5054114     Document Type: Article

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