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Volumn 102, Issue 13, 2013, Pages

Compositional study of defects in microcrystalline silicon solar cells using spectral decomposition in the scanning transmission electron microscope

(7) Duchamp, M a Lachmann, M a Boothroyd, C B a Kovacs A a Haug, F J b Ballif, C b Dunin Borkowski, R E a

a FORSCHUNGSZENTRUM JÜLICH (Germany)

b EPFL (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL COMPOSITIONS; COMPOSITIONAL STUDIES; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; FITTING PROCEDURE; MICROCRYSTALLINE THIN FILMS; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SPECTRAL DECOMPOSITION; UNMIXING ALGORITHMS;

ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; SILICON; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDE;

SILICON SOLAR CELLS;

EID: 84876115142 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4800569 Document Type: Article

Times cited : (20)

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