Improved morphology and performance of solution-processed metal-oxide thin-film transistors due to a polymer based interface modifier

Advanced Materials Interfaces

Volumn 1, Issue 7, 2014, Pages

  Weber, Corinna ^a   Oberberg, Moritz ^a   Weber, Dennis ^b   Bock, Claudia ^a   Pham, Duy Vu ^b   Kunze, Ulrich ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

^b EVONIK INDUSTRIES AG   (Germany)

Author keywords

contact resistance; interface modifier; metal oxide thin film transistors; sheet resistance; solution processed

Indexed keywords

ACTIVATION ENERGY; CONTACT RESISTANCE; ELECTRODES; INDIUM COMPOUNDS; INTERFACES (MATERIALS); METALS; MORPHOLOGY; POLYMERS; SHEET METAL; SHEET RESISTANCE; THIN FILM CIRCUITS; THIN FILMS; WORK FUNCTION;

BOTTOM-CONTACT TRANSISTORS; CARRIER ACTIVATION ENERGY; DIELECTRIC/SEMICONDUCTOR INTERFACE; INTERFACE MODIFIERS; METAL OXIDE THIN-FILM TRANSISTORS; SOLUTION-PROCESSED; THIN FILM TRANSISTORS (TFTS); WORK-FUNCTION DETERMINATIONS;

THIN FILM TRANSISTORS;

EID: 84919889794     PISSN: None     EISSN: 21967350     Source Type: Journal    
DOI: 10.1002/admi.201400137     Document Type: Article

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