SCOPUS 정보 검색 플랫폼

Volumn 1, Issue 5, 2014, Pages 903-908

Characterization of Ta-Ti Thin Films by using a Scanning Droplet Cell in Combination with AC Linear Sweep Voltammetry

(8) Fan, Mu a Sliozberg, Kirill a La Mantia, Fabio a Miyashita, Naoko b Hagymási, Marcel b Schnitter, Christoph b Ludwig, Alfred a Schuhmann, Wolfgang a

a RUHR UNIVERSITY BOCHUM (Germany)

b HC Starck GmbH (Germany)

Author keywords

High throughput screening; Linear sweep voltammetry; Scanning droplet cell; Thin films; Valve metals

Indexed keywords

ANODIC OXIDATION; CAPACITANCE; DEPOSITION; DROPS; ELECTRIC IMPEDANCE MEASUREMENT; METALS; SCANNING; VOLTAMMETRY;

ALTERNATING CURRENT VOLTAGES; CONCENTRATION GRADIENTS; HIGH THROUGHPUT SCREENING; LINEAR SWEEP VOLTAMMETRY; MATERIALS LIBRARIES; RELATIVE PERMITTIVITY; SCANNING DROPLET CELL; VALVE METAL;

THIN FILMS;

EID: 84919701817 PISSN: None EISSN: 21960216 Source Type: Journal
DOI: 10.1002/celc.201300153 Document Type: Article

Times cited : (7)

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