Dielectric and mechanical properties of anodic films in the Ta-Ti system

Surface and Interface Analysis

Volumn 35, Issue 5, 2003, Pages 477-482

  Mato, S ^a   Alcala G ^a   Skeldon, P ^a   Thompson, G E ^a   Mann, A B ^a   Masheder, D ^b   Habazaki, H ^c   Shimizu, K ^d  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b AVX Ltd   (United Kingdom)

^c HOKKAIDO UNIVERSITY   (Japan)

^d KEIO UNIVERSITY   (Japan)

Author keywords

Alloys; Anodic films; Anodizing; Nanoindentation; Tantalum; Titanium

Indexed keywords

AMORPHOUS MATERIALS; ANODIC OXIDATION; DIELECTRIC PROPERTIES; ELASTIC MODULI; HARDNESS; MECHANICAL PROPERTIES; MECHANICAL VARIABLES MEASUREMENT; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPUTTER DEPOSITION; TRANSMISSION ELECTRON MICROSCOPY;

ANODIC FILMS; ANODIC TANTALA; NANOINDENTATION;

TANTALUM ALLOYS;

EID: 0038015660     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1549     Document Type: Article

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