Chemical quantification of atomic-scale EDS maps under thin specimen conditions

Microscopy and Microanalysis

Volumn 20, Issue 6, 2014, Pages 1782-1790

  Lu, Ping ^a   Romero, Eric ^a   Lee, Shinbuhm ^b   Macmanus Driscoll, Judith L ^b   Jia, Quanxi ^c  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

antiphase boundaries; atomic scale mapping; chemical quantification; EDS; SrTiO3

Indexed keywords

EID: 84919476458     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927614013245     Document Type: Article

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