Pulsed laser deposition of epitaxial and polycrystalline bismuth vanadate thin films

Journal of Physical Chemistry C

Volumn 118, Issue 46, 2014, Pages 26543-26550

  Rettie, Alexander J E ^a   Mozaffari, Shirin ^b   McDaniel, Martin D ^a   Pearson, Kristen N ^a   Ekerdt, John G ^a   Markert, John T ^b   Mullins, C Buddie ^a,b  

^a The University of Texas at Austin   (United States)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BISMUTH; BISMUTH COMPOUNDS; FILM GROWTH; MORPHOLOGY; NANOCOMPOSITES; OXIDE FILMS; OXYGEN; PULSED LASER DEPOSITION; PULSED LASERS; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; SODIUM COMPOUNDS; SODIUM SULFITE; SUBSTRATES; TIN OXIDES; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; YTTRIA STABILIZED ZIRCONIA; YTTRIUM METALLOGRAPHY; YTTRIUM OXIDE; ZIRCONIA;

BISMUTH VANADATES; EPITAXIAL RELATIONSHIPS; FLUORINE DOPED TIN OXIDE; OXYGEN-RELATED DEFECTS; POLYCRYSTALLINE FILM; POST DEPOSITION ANNEALING; STOICHIOMETRIC FILMS; SUBSTRATE TEMPERATURE;

THIN FILMS;

EID: 84914689305     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp5082824     Document Type: Article

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